Publication Abstracts

Johns et al. 1976

Johns, J.W.C., W.A. Kreiner, and J. Susskind, 1976: Measurement and analysis of the ν4 band of silane. J. Molec. Spectrosc., 60, 400-411, doi:10.1016/0022-2852(76)90143-0.

The ν4 band of silane has been recorded with a resolution of about 0.06 /cm in the region from 850 to 950 /cm. Assignments of all allowed transitions in this range with J' ≤ 12 have been made on the basis of frequency and relative intensity. Qualitative agreement with theory is good but quantitative agreement begins to break down above J' = 8. The breakdown is attributed to the effects of the strong Coriolis interaction with nearby ν2.

Lines of 29SiH4 and 30SiH4 have been observed in the R branch with constant isotope shifts of -1.334 /cm and -2.600 /cm.

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BibTeX Citation

  author={Johns, J. W. C. and Kreiner, W. A. and Susskind, J.},
  title={Measurement and analysis of the ν4 band of silane},
  journal={J. Molec. Spectrosc.},

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RIS Citation

ID  - jo09000a
AU  - Johns, J. W. C.
AU  - Kreiner, W. A.
AU  - Susskind, J.
PY  - 1976
TI  - Measurement and analysis of the ν4 band of silane
JA  - J. Molec. Spectrosc.
VL  - 60
SP  - 400
EP  - 411
DO  - 10.1016/0022-2852(76)90143-0
ER  -

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