Johns et al. 1976

Johns, J.W.C., W.A. Kreiner, and J. Susskind, 1976: Measurement and analysis of the ν₄ band of silane. J. Molec. Spectrosc., 60, 400-411, doi:10.1016/0022-2852(76)90143-0.

The ν₄ band of silane has been recorded with a resolution of about 0.06 /cm in the region from 850 to 950 /cm. Assignments of all allowed transitions in this range with J' ≤ 12 have been made on the basis of frequency and relative intensity. Qualitative agreement with theory is good but quantitative agreement begins to break down above J' = 8. The breakdown is attributed to the effects of the strong Coriolis interaction with nearby ν₂.

Lines of 29SiH₄ and 30SiH₄ have been observed in the R branch with constant isotope shifts of -1.334 /cm and -2.600 /cm.

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Johns, J.W.C., Kreiner, W.A., and Susskind, J.: Measurement and analysis of the ν₄ band of silane, J. Molec. Spectrosc., 60, 400-411, doi:10.1016/0022-2852(76)90143-0, 1976.

Johns, J.W.C., W.A. Kreiner, and J. Susskind (1976), Measurement and analysis of the ν₄ band of silane, J. Molec. Spectrosc., 60, 400-411, doi:10.1016/0022-2852(76)90143-0.

Johns, J.W.C., W.A. Kreiner, and J. Susskind, 1976: Measurement and analysis of the ν₄ band of silane. J. Molec. Spectrosc., 60, 400-411, doi:10.1016/0022-2852(76)90143-0.

Johns, J.W.C., Kreiner, W.A., & Susskind, J. 1976, J. Molec. Spectrosc., 60, 400, doi:10.1016/0022-2852(76)90143-0.

Johns JWC, Kreiner WA, Susskind J. Measurement and analysis of the ν₄ band of silane, J Molec Spectrosc 1976;60:400-411. doi:10.1016/0022-2852(76)90143-0.

J.W.C. Johns, W.A. Kreiner, J. Susskind, J. Molec. Spectrosc. 60, 400-411, doi:10.1016/0022-2852(76)90143-0 (1976).